If this page is still visible after a couple seconds,
click here to force closing this window,
and report to the webmaster
(under "home > contact > webmaster")
any error you might see in the page...
JEOL-8600 microprobe database (CU Boulder) | Print date: 10/01/2020 (14:25)
Prepare your quantitative analysis setting
This form will help you prepare your analysis by proposing all available x-ray line(s), crystal(s) and standard(s) for a series of elements,
Enter first the parameters for your analysis
Enter the acceleration voltage (in kV) to use for your analysis (1 to 50 kV; default is 15 kV).
List one or more element(s) to analyze separated by a single space.
List one or more other element(s) separated by a single space.
These are elements present in the sample but NOT analyzed, and will only be used to check for possible peak or background interference (together with the elements to analyze).
To check for ANY possible peak or background interference, check the box "Include ALL elements". However, be aware this will yield a LARGE output...
Enter the minimum intensity (in percent of major x-ray line) to limit the output. The intensity is maximum (100%) for each Kα, Lα and Mα lines, and decrease rapidely. Enter a number from 1 to 100 (by default set to 20).
Choose the window in sinθ unit to look for interferences. This window is related to the wavelength through Bragg's law: n * λ = 2d * sinθ.
For most application, a window of 0.035 sinθ (±12.5 mm on JEOL with a 140 mm Rowland circle) should be sufficient. You will have the possibility to review in detail the interferences for each element separately.
Enter the minimum intensity (in percent of major x-ray line) to limit the search of peak interferences. Enter a value from 0 to 100. To look for major interferences, a value of 5% is sufficient, but you might want to lower this value for minor or trace element analysis (e.g. 1, 0.1 or even 0 to show all interferences).
Select the maximum x-ray line order to look for possible interference. 1 or 2 should give you the major possible interferences; 3rd order and more are usually insignificant unless you are analyzing trace element.
When checked, only the major X-ray line will be selected for each element based on maximum intensity and maximum ionization energy (but at least twice the selected voltage).
This is a quick way to get a setting, but it can result in unwanted selection of x-ray line...
Colorado University at Boulder - EMP facility © 2012
Webmaster (Julien Allaz): firstname.lastname@example.org | Lab manager (Julien Allaz, Kevin Mahan): email@example.com
Colorado University at Boulder - EMP facility © 2012 |
Julien Allaz, Kevin Mahan
Memory usage: 114.2 kb || Page generated in 0.0437 s